File:Serial-Section-Scanning-Electron-Microscopy-(S3EM)-on-Silicon-Wafers-for-Ultra-Structural-Volume-pone.0035172.s001.ogv
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Serial-Section-Scanning-Electron-Microscopy-(S3EM)-on-Silicon-Wafers-for-Ultra-Structural-Volume-pone.0035172.s001.ogv (Ogg Theora video file, length 14 s, 800 × 600 pixels, 7.56 Mbps, file size: 13.01 MB)
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[edit]DescriptionSerial-Section-Scanning-Electron-Microscopy-(S3EM)-on-Silicon-Wafers-for-Ultra-Structural-Volume-pone.0035172.s001.ogv |
English: Image stack consisting of 100 consecutive sections (raw data as recorded with the SEM at constant acquisition settings) covering 11 µm×8.3 µm×3.5 µm of tissue volume at 3.7 nm×3.7 nm lateral pixel resolution and 35 nm axial physical resolution. Note that the sections are not aligned, hence jitter reflects the slice-to-slice variability in manually identifying the region of interest. The calyx diagonally spans the image from the upper left to the lower right corner. The principal cell occupies the lower left side and an axon appears on the upper right side of the image. |
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Source | Movie S1 from Horstmann H, Körber C, Sätzler K, Aydin D, Kuner T (2012). "Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues". PLOS ONE. DOI:10.1371/journal.pone.0035172. PMID 22523574. PMC: 3327660. | ||
Author | Horstmann H, Körber C, Sätzler K, Aydin D, Kuner T | ||
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 16:34, 19 November 2012 | 14 s, 800 × 600 (13.01 MB) | Open Access Media Importer Bot (talk | contribs) | Automatically uploaded media file from Open Access source. Please report problems or suggestions here. |
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Usage terms | http://creativecommons.org/licenses/by/3.0/ |
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Software used | Xiph.Org libtheora 1.1 20090822 (Thusnelda) |
Date and time of digitizing | 2012 |